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 IDT54/74FCT823A/B/C HIGH-PERFORMANCECMOSBUFFER
MILITARY AND COMMERCIAL TEMPERATURE RANGES
HIGH PERFORMANCE CMOS BUS INTERFACE REGISTER
FEATURES: DESCRIPTION:
IDT54/74FCT823A/B/C
* Equivalent to AMD's Am29823 bipolar registers in pinout/ function, speed, and output drive over full temperature and voltage supply extremes * IDT54/74FCT823A equivalent to FASTTM speed * IDT54FCT823B 25% faster than FAST * IDT74FCT823C 40% faster than FAST * Buffered common Clock Enable (EN) and Asynchronous Clear Input (CLR) * IOL = 48mA (commercial) and 32mA (military) * Clamp diodes on all inputs for ringing suppression * CMOS power levels (1mW typ. static) * TTL input and output compatibility * CMOS output level compatible * Substantially lower input current levels than AMD's bilopar Am29800 series (5A max.) * MIlitary product compliant to MIL-STD-883, Class B * Available in the following packages: - Commercial: SOIC - Military: CERDIP, LCC
The FCT823 series is built using an advanced dual metal CMOS technology. The FCT823 bus interface registers are designed to eliminate the extra packages required to buffer existing registers and provide extra data width for wider address/data paths or buses carrying parity. The FCT823 is a 9-bit wide buffered register with Clock Enable (EN) and Clear (CLR) - ideal for parity bus interfacing in high-performance microprogrammed systems. The FCT823 high-performance interface family is designed for highcapacitance load drive capability, while providing low-capacitance bus loading at both inputs and outputs. All inputs have clamp diodes and all outputs are designed for low-capacitance bus loading in high-impedance state.
FUNCTIONAL BLOCK DIAGRAM
D0
14
DN
EN
CLR
11
D
CL
Q Q
D
CL
Q Q
CP
CP
CP
13
OE
1
Y0
The IDT logo is a registered trademark of Integrated Device Technology, Inc.
YN
MILITARY AND COMMERCIAL TEMPERATURE RANGES
1
JUNE 2002
DSC-5426/3
(c) 2002 Integrated Device Technology, Inc.
IDT54/74FCT823A/B/C HIGH-PERFORMANCECMOSBUFFER
MILITARY AND COMMERCIAL TEMPERATURE RANGES
PIN CONFIGURATION
OE D1 NC D0 Y0
27
D0 D1 D2 D3 D4 D5 D6 D7 D8 CLR GND
2 3 4 5 6 7 8 9 10 11 12
23 22 21 20 19 18 17 16 15 14 13
Y0 Y1 Y2 Y3 Y4 Y5 Y6 Y7 Y8 EN CP D2 D3 D4 NC D5 D6 D7
5 6 7 8 9 10
4
3
2 1
28
26 25 24 23 22 21 20 19
Y1
INDEX
VCC
OE
1
24
VCC
Y2 Y3 Y4 NC Y5 Y6 Y7
11 12
13
14
15
16
17
18
GND
CLR
NC
D8
EN
CERDIP/ SOIC TOP VIEW
LCC TOP VIEW
ABSOLUTE MAXIMUM RATINGS(1)
Symbol VTERM(2) VTERM(3) TA TBIAS TSTG PT IOUT Rating Terminal Voltage with Respect to GND Terminal Voltage with Respect to GND Operating Temperature Temperature under BIAS Storage Temperature Power Dissipation DC Output Current 0 to +70 -55 to +125 -55 to +125 0.5 120 -55 to +125 -65 to +135 -65 to +150 0.5 120 C C C W mA -0.5 to VCC -0.5 to VCC V Commercial -0.5 to +7 Military -0.5 to +7 Unit V
LOGIC SYMBOL
9 D D Q CP CP EN CLR OE EN CLR 9 Y
PIN DESCRIPTION
Pin Name Dx CLR I/O I I Description D flip-flop data inputs For both inverting and non-inverting registers, when the clear input is LOW and OE is LOW, the Qx outputs are LOW. When the clear input is HIGH, data can be entered into the register. Clock Pulse for the Register; enters data into the register on the LOW-to-HIGH transition. Register 3-state outputs Clock Enable. When the clock enable is LOW, data on the DI input is transferred to the QI output on the LOW-to-HIGH clock transition. When the clock enable is HIGH, the QI outputs do not change state, regardless of the data or clock input transitions. Output Control. When the OE input is HIGH, the Yx outputs are in the high impedance state. When the OE input is LOW, the TRUE register data is present at the Yx outputs.
NOTES: 1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability. No terminal voltage may exceed Vcc by +0.5V unless otherwise noted. 2. Input and Vcc terminals only. 3. Output and I/O terminals only.
CP Yx EN
I O I
CAPACITANCE (TA = +25C, F = 1.0MHz)
Symbol CIN COUT Parameter(1) Input Capacitance Output Capacitance Conditions VIN = 0V VOUT = 0V Typ. 6 8 Max. 10 12 Unit pF pF
NOTE: 1. This parameter is measured at characterization but not tested.
OE
I
2
CP
Y8
IDT54/74FCT823A/B/C HIGH-PERFORMANCECMOSBUFFER
MILITARY AND COMMERCIAL TEMPERATURE RANGES
FUNCTION TABLE(1)
Inputs OE H H H L H L H H L L CLR H H L L H H H H H H EN L L X X H H L L L L Dx L H X X X X L H L H CP X X X X Internal/ Outputs Qx Yx L Z H Z L Z L L NC Z NC NC L Z H Z L L H H Function High Z Clear Hold Load
NOTE: 1. H = HIGH Voltage Level L = LOW Voltage Level X = Don't Care Z = High Impedance = LOW-to-HIGH Transition
DC ELECTRICAL CHARACTERISTICS OVER OPERATING RANGE
Following Conditions Apply Unless Otherwise Specified: VLC = 0.2V; VHC = VCC - 0.2V Commercial: TA = 0C to +70C, VCC = 5.0V 5%, Military: TA = -55C to +125C, VCC = 5.0V 10%
Symbol VIH VIL IIH IIL IOZH IOZL VIK IOS VOH Off State (High Impedance) Output Current Clamp Diode Voltage Short Circuit Current Output HIGH Voltage VCC = Max. Parameter Input HIGH Level Input LOW Level Input HIGH Current VCC = Max. Input LOW Current Test Conditions(1) Guaranteed Logic HIGH Level Guaranteed Logic LOW Level VI = VCC VI = 2.7V VI = 0.5V VI = GND VO = VCC VO = 2.7V VO = 0.5V VO = GND GND(3) Min. 2 -- -- -- -- -- -- -- -- -- -- -75 VHC VHC 2.4 2.4 -- -- -- -- Typ.(2) -- -- -- -- -- -- -- -- -- -- -0.7 -120 VCC VCC 4.3 4.3 GND GND 0.3 0.3 Max. -- 0.8 5 5(4) -5(4) -5 10 10(4) -10(4) -10 -1.2 -- -- -- -- -- VLC VLC(4) 0.5 0.5 A A Unit V V
VCC = Min., IIN = -18mA VCC = Max., VO = VCC = 3V, VIN = VLC or VHC, IOH = -32A VCC = Min IOH = -300A VIN = VIH or VIL IOH = -15mA MIL IOH = -24mA COM'L VCC = 3V, VIN = VLC or VHC, IOL = 300A VCC = Min IOL = 300A VIN = VIH or VIL IOL = 32mA MIL IOL = 48mA COM'L
V mA V
VOL
Output LOW Voltage
V
NOTES: 1. For conditions shown as Min. or Max., use appropriate value specified under Electrical Characteristics for the applicable device type. 2. Typical values are at VCC = 5.0V, +25C ambient and maximum loading. 3. Not more than one output should be tested at one time. Duration of the test should not exceed one second. 4. This parameter is guaranteed but not ttested.
3
IDT54/74FCT823A/B/C HIGH-PERFORMANCECMOSBUFFER
MILITARY AND COMMERCIAL TEMPERATURE RANGES
POWER SUPPLY CHARACTERISTICS
VLC = 0.2V; VHC = VCC - 0.2V
Symbol ICC ICC ICCD Parameter Quiescent Power Supply Current Quiescent Power Supply Current TTL Inputs HIGH Dynamic Power Supply Current(4) Test Conditions(1) VCC = Max. VIN VHC; VIN VLC VCC = Max. VIN = 3.4V(3) VCC = Max. Outputs Open OE = EN = GND One Input Toggling 50% Duty Cycle VCC = Max. Outputs Open fCP = 10MHz 50% Duty Cycle OE = EN = GND One Bit Toggling at fi = 5MHz 50% Duty Cycle VCC = Max. Outputs Open fCP = 10MHz 50% Duty Cycle OE = EN = GND at fi = 2.5MHz Eight Bits Toggling VIN VHC VIN VLC Min. -- -- -- Typ.(2) 0.2 0.5 0.15 Max. 1.5 2 0.25 Unit mA mA mA/ MHz
IC
Total Power Supply Current(6)
VIN VHC VIN VLC (FCT) VIN = 3.4V VIN = GND
--
1.7
4
mA
--
2.2
6
VIN VHC VIN VLC (FCT) VIN = 3.4V VIN = GND
--
4
7.8(5)
--
6.2
16.8(5)
NOTES: 1. For conditions shown as Min. or Max., use appropriate value specified under Electrical Characteristics for the applicable device type. 2. Typical values are at VCC = 5.0V, +25C ambient. 3. Per TTL driven input (VIN = 3.4V). All other inputs at VCC or GND. 4. This parameter is not directly testable, but is derived for use in Total Power Supply Calculations. 5. Values for these conditions are examples of ICC formula. These limits are guaranteed but not tested. 6. IC = IQUIESCENT + IINPUTS + IDYNAMIC IC = ICC + ICC DHNT + ICCD (fCP/2 + fiNi) ICC = Quiescent Current ICC = Power Supply Current for a TTL High Input (VIN = 3.4V) DH = Duty Cycle for TTL Inputs High NT = Number of TTL Inputs at DH ICCD = Dynamic Current caused by an Input Transition Pair (HLH or LHL) fCP = Clock Frequency for register devices (zero for non-register devices) fi = Input Frequency Ni = Number of Inputs at fi All currents are in milliamps and all frequencies are in megahertz.
4
IDT54/74FCT823A/B/C HIGH-PERFORMANCECMOSBUFFER
MILITARY AND COMMERCIAL TEMPERATURE RANGES
SWITCHING CHARACTERISTICS OVER OPERATING RANGE
54/74FCT823A Com'l. Symbol tPLH tPHL Parameter Propagation Delay CP to Yx (OE = LOW) Condition(1) CL = 50pF RL = 500 CL = 300pF(3) RL = 500 CL = 50pF RL = 500 CL = 300pF(3) RL = 500 CL = 5pF(3) RL = 500 CL = 50pF RL = 500 CL = 50pF RL = 500 Min.(2) -- -- -- -- -- -- 4 2 2 -- 6 7 6 Max. 10 20 12 23 7 8 -- -- -- 14 -- -- -- Min.(2) -- -- -- -- -- -- 4 2 2 -- 7 7 7 Mil. Max. 11.5 20 13 25 8 9 -- -- -- 15 -- -- -- 54FCT823B Mil. Min.(2) Max. -- 8.5 -- -- -- -- -- 3 1.5 0 -- 6 6 6 16 9 16 7 8 -- -- -- 9.5 -- -- -- 74FCT823C Com'l. Min.(2) Max. -- 6 -- -- -- -- -- 3 1.5 0 -- 6 6 6 12.5 7 12.5 6.2 6.5 -- -- -- 8 -- -- -- ns ns ns ns ns ns ns ns ns Unit ns
tPZH tPZL
Output Enable Time, OE to Yx
tPHZ tPLZ
Output Disable Time, OE to Yx
tSU tH tH tPHL tREM tW tW
Set-up Time HIGH or LOW, Dx to CP Set-up Time HIGH or LOW, EN to CP Hold Time HIGH or LOW, Dx to CP Hold Time HIGH or LOW, EN to CP Propagation Delay, CLR to Yx Recovery Time, CLR to CP CP Pulse Width HIGH or LOW CLR Pulse Width HIGH or LOW
NOTES: 1. See test circuit and waveforms. 2. Minimum limits are guaranteed but not tested on Propagation Delays. 3. These parameters are guaranteed but not tested.
5
IDT54/74FCT823A/B/C HIGH-PERFORMANCECMOSBUFFER
MILITARY AND COMMERCIAL TEMPERATURE RANGES
TEST CIRCUITS AND WAVEFORMS
V CC 500 VIN Pulse Generator RT D.U.T . VOUT 7.0V
SWITCH POSITION
Test Open Drain Disable Low Enable Low Switch Closed Open
50pF CL
500
All Other Tests
DEFINITIONS: CL = Load capacitance: includes jig and probe capacitance. RT = Termination resistance: should be equal to ZOUT of the Pulse Generator.
Octal link
Test Circuits for All Outputs
DATA INPUT TIMING INPUT ASYNCHRONOUS CONTROL PRESET CLEAR ETC. SYNCHRONOUS CONTROL PRESET CLEAR CLOCK ENABLE ETC.
tSU
tH
tREM
3V 1.5V 0V 3V 1.5V 0V 3V 1.5V 0V 3V 1.5V 0V
Octal link
LOW-HIGH-LOW PULSE tW HIGH-LOW-HIGH PULSE
Octal link
1.5V
1.5V
tSU
tH
Pulse Width
Set-Up, Hold, and Release Times
ENABLE SAME PHASE INPUT TRANSITION tPLH OUTPUT tPLH OPPOSITE PHASE INPUT TRANSITION tPHL tPHL 3V 1.5V 0V VOH 1.5V VOL 3V 1.5V 0V
Octal link
DISABLE 3V 1.5V 0V 3.5V 0.3V tPHZ 0.3V 1.5V 0V VOH 0V
Octal link
CONTROL INPUT tPZL OUTPUT NORMALLY LOW OUTPUT NORMALLY HIGH SWITCH CLOSED tPZH SWITCH OPEN 3.5V 1.5V tPLZ
VOL
Propagation Delay
Enable and Disable Times
NOTES: 1. Diagram shown for input Control Enable-LOW and input Control Disable-HIGH. 2. Pulse Generator for All Pulses: Rate 1.0MHz; ZO 50; tF 2.5ns; tR 2.5ns.
6
IDT54/74FCT823A/B/C HIGH-PERFORMANCECMOSBUFFER
MILITARY AND COMMERCIAL TEMPERATURE RANGES
ORDERING INFORMATION
IDT XX FCT XXXX Temp. Range Device Type XX Package X Process Blank B Commercial MIL-STD-883, Class B Commercial Options Small Outline IC Military Options CERDIP Leadless Chip Carrier
SO
D L
823A 823B 823C
High Performance CMOS Bus Interface Register, 9-Bit
54 74
- 55C to +125C - 40C to +85C
DATA SHEET DOCUMENT HISTORY
6/27/2002 Updated according to PDNs Logic-00-07 and Logic-01-04
CORPORATE HEADQUARTERS 2975 Stender Way Santa Clara, CA 95054
for SALES: 800-345-7015 or 408-727-6116 fax: 408-492-8674 www.idt.com
for Tech Support: logichelp@idt.com (408) 654-6459
7


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